SiO2 spin-on films of various concentrations of 1, 2, 6, 22 and 36 at.
% zinc have been fabricated and used for the p diffusion into undoped
n-type InP. An increasing zinc concentration (N-0) of the spin-on film
leads to a higher atomic zinc concentration (N-Zn) and diffusion dept
h in InP. From the experimental results a distribution coefficient N-Z
n/N-0 of 0.012 has been determined. A higher atomic zinc concentration
in InP results in a lower acceptor concentration. With additional hea
t treatment the electrical activity of zinc can be increased significa
ntly.