MAPPING OF COMPOSITION OF MINERAL SURFACES BY TOF-SIMS

Time-of-flight secondary ion mass spectrometry (TOF-SIMS) was used to characterize the surface composition of mineral particles from concent rator and laboratory test samples, The surface composition of mineral particles ranging in size from 20-100 micrometers was established by p robing a spot or by rastering a preselected area. The analytical depth resolution is sub-monolayer. Data presentation is in the form of posi tive or negative ion mass spectra and in the form of maps showing the distribution of elements or organic molecules, Activators, namely copp er and lead, and oxidation products on sphalerite, pyrrhotite, pyrite and quartz from the Geco zinc concentrate, were detected and mapped. A myl xanthate and di-isoamyl dithiophosphate on galena, from laboratory treated samples were detected and their distribution was mapped.