REAL-TIME OBSERVATION OF REFLECTANCE ANISOTROPY AND REFLECTION HIGH-ENERGY ELECTRON-DIFFRACTION INTENSITY OSCILLATIONS DURING GAS-SOURCE MOLECULAR-BEAM-EPITAXY GROWTH SI AND SIGE ON SI(001)

Authors
TURNER AR PEMBLE ME FERNANDEZ JM JOYCE BA ZHANG J TAYLOR AG
Citation
Ar. Turner et al., REAL-TIME OBSERVATION OF REFLECTANCE ANISOTROPY AND REFLECTION HIGH-ENERGY ELECTRON-DIFFRACTION INTENSITY OSCILLATIONS DURING GAS-SOURCE MOLECULAR-BEAM-EPITAXY GROWTH SI AND SIGE ON SI(001), Physical review letters, 74(16), 1995, pp. 3213-3216
Citations number
25
Categorie Soggetti
Physics
Journal title
Physical review letters → ACNP
ISSN journal
00319007
Volume
74
Issue
16
Year of publication
1995
Pages
3213 - 3216
Database
ISI
SICI code
0031-9007(1995)74:16<3213:ROORAA>2.0.ZU;2-#