IMPROVED ERROR-CORRECTION TECHNIQUE FOR ON-WAFVER LIGHTWAVE MEASUREMENTS OF PHOTODETECTORS

Authors
DEBIE P MARTENS L KAISER D
Citation
P. Debie et al., IMPROVED ERROR-CORRECTION TECHNIQUE FOR ON-WAFVER LIGHTWAVE MEASUREMENTS OF PHOTODETECTORS, IEEE photonics technology letters, 7(4), 1995, pp. 418-420
Citations number
5
Categorie Soggetti
Optics,"Physics, Applied
Journal title
IEEE photonics technology letters → ACNP
ISSN journal
10411135
Volume
7
Issue
4
Year of publication
1995
Pages
418 - 420
Database
ISI
SICI code
1041-1135(1995)7:4<418:IETFOL>2.0.ZU;2-Y
Abstract
An accurate correction technique for on-wafer small-signal lightwave m easurements of photodetectors is presented. This technique is an impro vement of the conventional calibration methods for on-wafer lightwave measurements. Mathematical expressions for the dominant error sources that exist in the measurement system are derived. Experimental results for an In-GaAs-InP PIN photodiode show a smoother modulation response characteristic when the presented technique is used.