ENVIRONMENTAL SCANNING ELECTRON-MICROSCOPY

Authors
Citation
Pjr. Uwins, ENVIRONMENTAL SCANNING ELECTRON-MICROSCOPY, Materials forum, 18, 1994, pp. 51-75
Citations number
269
Categorie Soggetti
Material Science
Journal title
ISSN journal
08832900
Volume
18
Year of publication
1994
Pages
51 - 75
Database
ISI
SICI code
0883-2900(1994)18:<51:ESE>2.0.ZU;2-X
Abstract
The ElectroScan environmental scanning electron microscope (ESEM) is o ne of the most exciting new developments in the field of Electron Micr oscopy. The ESEM differs from conventional Scanning Electron Microscop es (SEM) by being able to examine materials including liquids and oils in their natural state with no prior sample preparation. Accessory eq uipment, cooling, heating and manipulating devices allow the manipulat ion of samples thus making it possible for the first time to image dyn amic processes such as wetting, drying, absorption, corrosion, melting , crystallisation, curing and fracturing at high magnification.