The novel surface analysis technique of multi-spectral Auger microscop
y (MULSAM) has been used to study simultaneously and at high resolutio
n the chemical and topographic variations across wear scars generated
with model oil formulations. This is the first time this technique has
been applied to anything other than well-characterised samples from t
he semiconductor industry. The MULSAM image manipulations prove suffic
iently robust to allow meaningful work on these extremely non-ideal sp
ecimens. The work leads to new insights into the composition and spati
al distribution of anti-wear films. In particular, the results show si
gnificant correlations between the surface topography and the local ch
emical nature of the anti-wear film.