A. Kaser et E. Gerlach, SCATTERING OF CONDUCTION ELECTRONS BY SURFACE-ROUGHNESS IN THIN METAL-FILMS, Zeitschrift fur Physik. B, Condensed matter, 97(1), 1995, pp. 139-146
A fluctuation transport theory is applied to describe the extra resist
ivity of thin metal films due to electron scattering at rough surfaces
. This scattering mechanism is described in terms of the surface profi
le autocorrelation. If the lateral extension of the surface structures
exceeds the Fermi wavelength, the scattering can be described by a st
ep density of terrace edges.