SCATTERING OF CONDUCTION ELECTRONS BY SURFACE-ROUGHNESS IN THIN METAL-FILMS

Authors
Citation
A. Kaser et E. Gerlach, SCATTERING OF CONDUCTION ELECTRONS BY SURFACE-ROUGHNESS IN THIN METAL-FILMS, Zeitschrift fur Physik. B, Condensed matter, 97(1), 1995, pp. 139-146
Citations number
20
Categorie Soggetti
Physics, Condensed Matter
ISSN journal
07223277
Volume
97
Issue
1
Year of publication
1995
Pages
139 - 146
Database
ISI
SICI code
0722-3277(1995)97:1<139:SOCEBS>2.0.ZU;2-C
Abstract
A fluctuation transport theory is applied to describe the extra resist ivity of thin metal films due to electron scattering at rough surfaces . This scattering mechanism is described in terms of the surface profi le autocorrelation. If the lateral extension of the surface structures exceeds the Fermi wavelength, the scattering can be described by a st ep density of terrace edges.