Scanning tunneling microscopy has been used to study misfit-dislocatio
n (MD) induced lattice distortion of the epilayer for InAs thin films
grown on GaAs(110). Two-dimensional (2D) islands with regular size are
observed in the first two monolayers. Interfacial MDs, identified in
the images by an array of dark lines, appear following the coalescence
of the 2D islands. The growth mode remains 2D for all coverages and t
he vertical contrast of these Lines decreases with: film thickness. Th
e surface contrast can be explained only by classical elasticity theor
y if the properties of a thin InAs film with an exposed surface are co
nsidered.