SURFACE CONTRAST IN 2 DIMENSIONALLY NUCLEATED MISFIT DISLOCATIONS IN INAS GAAS(110) HETEROEPITAXY/

Citation
Jg. Belk et al., SURFACE CONTRAST IN 2 DIMENSIONALLY NUCLEATED MISFIT DISLOCATIONS IN INAS GAAS(110) HETEROEPITAXY/, Physical review letters, 78(3), 1997, pp. 475-478
Citations number
19
Categorie Soggetti
Physics
Journal title
ISSN journal
00319007
Volume
78
Issue
3
Year of publication
1997
Pages
475 - 478
Database
ISI
SICI code
0031-9007(1997)78:3<475:SCI2DN>2.0.ZU;2-V
Abstract
Scanning tunneling microscopy has been used to study misfit-dislocatio n (MD) induced lattice distortion of the epilayer for InAs thin films grown on GaAs(110). Two-dimensional (2D) islands with regular size are observed in the first two monolayers. Interfacial MDs, identified in the images by an array of dark lines, appear following the coalescence of the 2D islands. The growth mode remains 2D for all coverages and t he vertical contrast of these Lines decreases with: film thickness. Th e surface contrast can be explained only by classical elasticity theor y if the properties of a thin InAs film with an exposed surface are co nsidered.