Ay. Vainer et Km. Dyumaev, ONIUM SALTS AS RADIATION-SENSITIVE ACID GENERATORS FOR RESISTS WITH CHEMICAL AMPLIFICATION (REVIEW), Russian journal of applied chemistry, 67(4), 1994, pp. 469-479
The necessity of mastering alternative lithographic processes for deve
lopment and production of 64 and 256 Mbit dynamic random-access memory
units has been substantiated. It is shown that conventional positive
photoresists based on diazonaphthoquinone and novolac resins do not me
et the requirements of modern microlithography. The concept of chemica
l amplification offered a means for developing adequate topological st
ructures with sizes of resist components of 0.35 mu m or less. Onium s
alts are universal and efficient acid generators for resists with chem
ical amplification. Studies in the field of photo- and radiochemistry
of onium salts have been summarized and correlated. It has been shown
that the quantum yield and distribution of photolysis products are gov
erned to a major extent by geminal and bulk recombination. Specific fe
atures of photolysis and radiolysis of onium salts in a polymer matric
are considered.