Leaf area index (LAI) is widely used in many facets of potato (Solanum
tuberosum L.) modelling but direct measurements have historically bee
n difficult. This investigation tested the accuracy of a commercially
available instrument (LI-COR LAI-2000) for measuring LAI non-destructi
vely on a potato crop. Accurate estimates of LAI were difficult to obt
ain with small plots of approximate to 1 m(2). Results from larger fie
ld plots were extremely favourable and indicate that non-destructive m
easurements of LAI in situ can routinely be estimated within 5 to 10%
of the destructively measured LAI. Six thinning tests performed on fou
r potato cultivars produced average root mean square error measurement
s of LAI that ranged from 0.09 to 0.27.