K. Torek et al., REDUCED PRESSURE ETCHING OF THERMAL OXIDES IN ANHYDROUS HF ALCOHOLIC GAS-MIXTURES/, Journal of the Electrochemical Society, 142(4), 1995, pp. 1322-1326
Reduced pressure etching of thermal oxide in anhydrous HF gas with thr
ee different alcoholic solvent vapors is studied. Thermal oxide etch r
ates as functions of temperature, pressure, time, and HF partial press
ure are presented for methanol, ethanol-water azeotrope (95.6% ethanol
, 4.4% water), and 2-propanol (isopropyl alcohol). The etch rates are
interpreted in terms of alcohol vapor pressure, KF ionization, and rea
ction product desorption. The efficient desorption of reaction product
s compared to vapor HF/H2O is believed to be responsible for both the
wider process window for alcoholic solvents and the alleviation of the
solid residue formation problem. Among the alcoholic solvents studied
, methanol has the best potential while 2-propanol can also be useful
in selected applications.