REDUCED PRESSURE ETCHING OF THERMAL OXIDES IN ANHYDROUS HF ALCOHOLIC GAS-MIXTURES/

Citation
K. Torek et al., REDUCED PRESSURE ETCHING OF THERMAL OXIDES IN ANHYDROUS HF ALCOHOLIC GAS-MIXTURES/, Journal of the Electrochemical Society, 142(4), 1995, pp. 1322-1326
Citations number
14
Categorie Soggetti
Electrochemistry
ISSN journal
00134651
Volume
142
Issue
4
Year of publication
1995
Pages
1322 - 1326
Database
ISI
SICI code
0013-4651(1995)142:4<1322:RPEOTO>2.0.ZU;2-7
Abstract
Reduced pressure etching of thermal oxide in anhydrous HF gas with thr ee different alcoholic solvent vapors is studied. Thermal oxide etch r ates as functions of temperature, pressure, time, and HF partial press ure are presented for methanol, ethanol-water azeotrope (95.6% ethanol , 4.4% water), and 2-propanol (isopropyl alcohol). The etch rates are interpreted in terms of alcohol vapor pressure, KF ionization, and rea ction product desorption. The efficient desorption of reaction product s compared to vapor HF/H2O is believed to be responsible for both the wider process window for alcoholic solvents and the alleviation of the solid residue formation problem. Among the alcoholic solvents studied , methanol has the best potential while 2-propanol can also be useful in selected applications.