CORRECTIONS TO THE VAN-DER-WAALS FORCES IN APPLICATION TO ATOMIC-FORCE MICROSCOPY

Authors
BORDAG M KLIMCHITSKAYA GL MOSTEPANENKO VM
Citation
M. Bordag et al., CORRECTIONS TO THE VAN-DER-WAALS FORCES IN APPLICATION TO ATOMIC-FORCE MICROSCOPY, Surface science, 328(1-2), 1995, pp. 129-134
Citations number
16
Categorie Soggetti
Chemistry Physical
Journal title
Surface science → ACNP
ISSN journal
00396028
Volume
328
Issue
1-2
Year of publication
1995
Pages
129 - 134
Database
ISI
SICI code
0039-6028(1995)328:1-2<129:CTTVFI>2.0.ZU;2-K
Abstract
The dependence of the van der Waals force on the distance between the atomic force microscope tip and the plane surface of the sample is cal culated. The tip is modelled by a paraboloid with stochastic perturbat ions of its surface. The analysis of the corresponding corrections to the van der Waals force shows that one may use the paraboloid model of the tip for the interpretation of all experimental data in atomic for ce microscopy.