Js. Cross et Gl. Schrader, LOW-PRESSURE CHEMICAL-VAPOR-DEPOSITION OF MOLYBDENUM OXIDES FROM MOLYBDENUM HEXACARBONYL AND OXYGEN, Thin solid films, 259(1), 1995, pp. 5-13
Thin films of molybdenum oxides were deposited at 300-500 degrees C an
d 200-1014 mTorr (26.6-135 Pa) from Mo(CO)(6), O-2, and H2O using an i
nductively heated low pressure chemical vapor deposition system. Two o
xygen gas flow rates of 5 and 15 seem were used. alpha-MoO3 films were
deposited at temperatures of 425-450 degrees C, pressures of 660-1014
mTorr (88.0-135 Pa), with an O-2 flow rate of 5 seem; and at 450-500
degrees C, 300-500 mTorr (40.0-66.7 Pa), with an O-2 flow rate of 5 se
em. The polycrystalline films were deposited on silicon (100) wafers a
nd exhibited preferred orientations. Gas phase decomposition of the pr
ecursor was significant with temperatures >400 degrees C and pressures
>600 mTorr (88.0 Pa), with an O-2 flow rate of 15 seem. Owing to deco
mposition of the precursor in the gas phase and low gas velocities, th
e films decreased in thickness in the direction of flow. Thermodynamic
equilibrium calculations indicated that alpha-MoO3 was the most stabl
e phase for all deposition conditions. However, alpha-MoO3 was deposit
ed only at high temperatures and pressures. A quadratic model of alpha
-MoO3 formation was developed using experimental design for the 5 seem
deposition data as a function of temperature and pressure. Both param
eters were significant in the formation of alpha-MoO3 films. The films
were characterized using X-ray diffraction and X-ray photoelectron, A
uger, and laser Raman spectroscopies.