S. Bhat et al., DIELECTRIC CHARACTERISTICS OF NEODYMIUM HEPTAMOLYBDATE CRYSTALS GROWNBY GEL ENCAPSULATION TECHNIQUE, Crystal research and technology, 30(2), 1995, pp. 267-273
Results obtained from the dielectric studies of neodymium heptamolybda
te crystals grown in the system Nd(NO3)(3)-MoO3-NH4OH-HNO3-Na2SiO3 by
gel encapsulation technique are presented. The variation of dielectric
constant (epsilon'), dielectric loss (tan delta) and conductivity (si
gma) with frequency at different temperatures is studied. The dielectr
ic constant of the material increases sharply, attains a peak value an
d then decreases rapidly, as material's temperature rises from room te
mperature to higher degrees. The temperature at which the peak value i
s attained is the transition temperature of the material. Dielectric l
oss (tan delta) follows almost a similar behaviour. The conductivity (
sigma) is also found to be temperature- and frequency-dependent. This
sharp rise in epsilon' is attributed to the contribution from space ch
arge polarization. Theoretically obtained data using the expression ep
silon' = a(0) + a(1)T(2) and -ln sigma = a + b(T - T-0)(2) for T < T-0
) fits very well with the experimentally obtained data indicating that
space charge polarization increases as some power of temperature larg
er than one.