Jk. Kang et Ic. Jeon, ATOMIC-FORCE MICROSCOPY STUDY OF A PEROVSKITE-TYPE LAYERED COMPOUND, (C5H5CH2CH2NH3)(2)CUCL4, Synthetic metals, 71(1-3), 1995, pp. 1879-1880
The surface structure of a layered compound (C6H5CH2CH2NH3)(2)CuCl4 wa
s examined by Atomic Force Microscopy (AFM) in ambient condition. Well
-defind AFM images with no defects mere obtained and the estimated cel
l dimensions from AFM experiments are well consistent with the powder
X-ray diffraction data of a = 7.58 Angstrom, b = 7.24 Angstrom, and c
= 38.70 Angstrom.