ATOMIC-FORCE MICROSCOPY STUDY OF A PEROVSKITE-TYPE LAYERED COMPOUND, (C5H5CH2CH2NH3)(2)CUCL4

Authors
Citation
Jk. Kang et Ic. Jeon, ATOMIC-FORCE MICROSCOPY STUDY OF A PEROVSKITE-TYPE LAYERED COMPOUND, (C5H5CH2CH2NH3)(2)CUCL4, Synthetic metals, 71(1-3), 1995, pp. 1879-1880
Citations number
8
Categorie Soggetti
Physics, Condensed Matter","Metallurgy & Metallurigical Engineering
Journal title
ISSN journal
03796779
Volume
71
Issue
1-3
Year of publication
1995
Pages
1879 - 1880
Database
ISI
SICI code
0379-6779(1995)71:1-3<1879:AMSOAP>2.0.ZU;2-9
Abstract
The surface structure of a layered compound (C6H5CH2CH2NH3)(2)CuCl4 wa s examined by Atomic Force Microscopy (AFM) in ambient condition. Well -defind AFM images with no defects mere obtained and the estimated cel l dimensions from AFM experiments are well consistent with the powder X-ray diffraction data of a = 7.58 Angstrom, b = 7.24 Angstrom, and c = 38.70 Angstrom.