DC CONDUCTANCE OF CUPC FILMS PREPARED BY PLASMA ACTIVATED EVAPORATION

Citation
Cg. Choi et al., DC CONDUCTANCE OF CUPC FILMS PREPARED BY PLASMA ACTIVATED EVAPORATION, Synthetic metals, 71(1-3), 1995, pp. 2307-2308
Citations number
2
Categorie Soggetti
Physics, Condensed Matter","Metallurgy & Metallurigical Engineering
Journal title
ISSN journal
03796779
Volume
71
Issue
1-3
Year of publication
1995
Pages
2307 - 2308
Database
ISI
SICI code
0379-6779(1995)71:1-3<2307:DCOCFP>2.0.ZU;2-M
Abstract
A CuPc film with good mechanical and gas sensing properties was prepar ed by the plasma activated evaporation method. The conductivity of the CuPc film approximately satisfies the following equation: sigma = sig ma (o) exp(-E/kT) where E is the activation energy. The activation ene rgies of the films deposited at high pressures (200 and 300mtorr) are 0.7 similar to 0.8eV which are almost the same with Eg/2 of the sublim ated CuPc film. For the films deposited at low pressures (20 and 100mt orr), the activation energies are 0.1 similar to 0.4 eV depending on t he gas environment. As the deposition pressure of the CuPc film decrea ses, the porosity of the film increases and thus the surface area wher e NOx gas molecules can be adsorbed increases. This results in the inc reases of the DC conductivity and the NOx gas sensing sensitivity with decreasing CuPc deposition pressure.