O. Alvarezfregoso et al., STRUCTURAL, OPTICAL AND ELECTRICAL-PROPERTIES CHARACTERIZATION OF CDSBTE THIN-FILMS GROWN BY RADIOFREQUENCY SPUTTERING, Journal of physics and chemistry of solids, 56(1), 1995, pp. 117-122
CdSbTe films have been prepared by radiofrequency sputtering of CdTe a
nd antimonium. The structural, electrical and optical properties were
investigated. The film dark conductivity increased monotonically with
increasing antimony content. The films structure was polycrystalline o
f zinc-blende type with a preferential orientation along the (111) dir
ection for Sb concentration up to around 12%. For larger concentration
s (30 less than or equal to Sb less than or equal to 60 at.%) the stru
cture is injured, showing amorphous-like diffraction patterns. Grain s
ize and band gap of the films decreased with increasing Sb content.