DETERMINATION OF LOCAL CRYSTAL QUALITY CH ARACTERISTICS AND OF THE ORIENTATION OF CDTE SEMICONDUCTOR-FILMS BY NONLINEAR-OPTICAL METHODS

Authors
BALANYUK VV KRASNOV VF MUSHER SL PROTS VI RYABCHENKO VE STOYANOV SA STRUTS SG STUPAK MF SYSKIN VS
Citation
Vv. Balanyuk et al., DETERMINATION OF LOCAL CRYSTAL QUALITY CH ARACTERISTICS AND OF THE ORIENTATION OF CDTE SEMICONDUCTOR-FILMS BY NONLINEAR-OPTICAL METHODS, Kvantovaa elektronika, 22(2), 1995, pp. 196-200
Citations number
4
Categorie Soggetti
Physics, Applied","Engineering, Eletrical & Electronic
Journal title
Kvantovaa elektronika → ACNP
ISSN journal
03687147
Volume
22
Issue
2
Year of publication
1995
Pages
196 - 200
Database
ISI
SICI code
0368-7147(1995)22:2<196:DOLCQC>2.0.ZU;2-I
Abstract
The local crystal quality of epitaxial CdTe films was investigated in the transmission geometry by generation of the second harmonic of a YA P:Nd laser. A computer controlled laser unit was constructed specifica lly for fast local diagnostics of the crystal quality of epitaxial fil ms.