EVALUATING THE SAFETY OF SELF-CHECKING CIRCUITS

Authors
Citation
Sj. Zhang et Jc. Muzio, EVALUATING THE SAFETY OF SELF-CHECKING CIRCUITS, JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 6(2), 1995, pp. 243-253
Citations number
16
Categorie Soggetti
Engineering, Eletrical & Electronic
ISSN journal
09238174
Volume
6
Issue
2
Year of publication
1995
Pages
243 - 253
Database
ISI
SICI code
0923-8174(1995)6:2<243:ETSOSC>2.0.ZU;2-I
Abstract
In this paper, we consider the evaluation of the safety of a self-chec king circuit with combinational logic. Since the circuit is tested und er normal operation, it may stay in different states such as a perfect state in which any erroneous output can be detected, unstable states in which an erroneous output may be detected or may not, a safe-state when the erroneous output has been caught, and a fail-state because th e erroneous output is undetected, as time goes on. Consequently, we pr opose a fail-safe evaluation, using a Markov model to describe the sta te transitions and predicate the probability of the circuit not being in the fail-state. We include a comparison with existing evaluation me thods, the proposed approach being more practical because it estimates the safety of the circuit, which is reducing as time goes on, instead of giving a constant probability measure.