W. Pfleging et al., STRUCTURE AND CHEMICAL-COMPOSITION OF BN THIN-FILMS GROWN BY PULSED-LASER DEPOSITION, DIAMOND AND RELATED MATERIALS, 4(4), 1995, pp. 370-374
BN thin films were produced by pulsed laser deposition from a sintered
BN target of the hexagonal structural phase using XeCl excimer laser
radiation (lambda = 308 nm) or pulsed CO2 laser radiation (lambda = 10
.6 mu m), and varying the process variables (laser fluence, N-2 partia
l pressure, target-substrate distance). Film properties such as chemic
al composition and crystal structure were studied by ex situ X-ray pho
toelectron, Auger electron and micro-Raman spectroscopies. Simple ther
modynamic arguments are given to explain aspects of material removal f
rom the target and film deposition. Films are generally composed of a
fine-grained matrix in which particles 10-15 mu m (lambda = 308 nm) or
10-100 mu m (lambda = 10.6 mu m) in size are embedded. In addition to
BN, the films contain contaminants B2O3, metallic B, and a boron-oxyn
itride species, with the relative proportions dependent on the lateral
position on the film surface. Micro-Raman spectra give evidence of am
orphous and hexagonal structural phases of the BN matrix material.