SCANNING PROBE MICROSCOPY .2. SCANNING TECHNOLOGY AND APPLICATIONS

Authors
PRATER CB MAIVALD PG KJOLLER KJ HEATON MG
Citation
Cb. Prater et al., SCANNING PROBE MICROSCOPY .2. SCANNING TECHNOLOGY AND APPLICATIONS, American laboratory, 27(6), 1995, pp. 50-54
Citations number
12
Categorie Soggetti
Instument & Instrumentation","Chemistry Analytical
Journal title
American laboratory → ACNP
ISSN journal
00447749
Volume
27
Issue
6
Year of publication
1995
Pages
50 - 54
Database
ISI
SICI code
0044-7749(1995)27:6<50:SPM.ST>2.0.ZU;2-L
Abstract
A recent advance in scanning probe microscopy is described for the ana lysis of surfaces that are easily damaged or are only weakly held to t heir substrates.