MORPHOLOGY, STRUCTURE AND SOME PROPERTIES OF WHISKERS OF SILICON-GERMANIUM SOLID-SOLUTIONS

Authors
VARSHAVA SS OSTROVSKAYA AS BAITSAR RI
Citation
Ss. Varshava et al., MORPHOLOGY, STRUCTURE AND SOME PROPERTIES OF WHISKERS OF SILICON-GERMANIUM SOLID-SOLUTIONS, UKRAINSKII FIZICHESKII ZHURNAL, 39(2), 1994, pp. 230-233
Citations number
12
Categorie Soggetti
Physics
Journal title
UKRAINSKII FIZICHESKII ZHURNAL → ACNP
ISSN journal
02023628
Volume
39
Issue
2
Year of publication
1994
Pages
230 - 233
Database
ISI
SICI code
0202-3628(1994)39:2<230:MSASPO>2.0.ZU;2-6
Abstract
The structure of the whiskers of Si-Ge solid solution (about 15 mass % of Ge ) grown in closed bromide system and homogeneity of the crystal s are investigated. The growth mechanism is discussed on the basis of the results of X-ray crystal microanalysis and other investigations. T he morphology and surface structure of the crystals are investigated. Resistivity of the crystals is measuted and fields of their prospectiv e applications are proposed.