MEASUREMENT-BASED MODEL PARAMETERS FOR QUASI-OPTICAL ELECTRON DEVICE ARRAYS

Authors
SJOGREN LB LIU HXL QIN XH DOMIER CW LUHMANN NC
Citation
Lb. Sjogren et al., MEASUREMENT-BASED MODEL PARAMETERS FOR QUASI-OPTICAL ELECTRON DEVICE ARRAYS, IEEE transactions on microwave theory and techniques, 43(4), 1995, pp. 899-901
Citations number
8
Categorie Soggetti
Engineering, Eletrical & Electronic
Journal title
IEEE transactions on microwave theory and techniques → ACNP
ISSN journal
00189480
Volume
43
Issue
4
Year of publication
1995
Part
1
Pages
899 - 901
Database
ISI
SICI code
0018-9480(1995)43:4<899:MMPFQE>2.0.ZU;2-E
Abstract
Impedance element values for a Schottky beam control diode array are o btained by curve-fitting quasioptical reflection coefficient measureme nts to a series RLC array model. The model provides a good representat ion of the array behavior, Parameters of Schottky varactor arrays test ed to-date are summarized, The technique should be applicable to other quasioptical arrays, as well.