RUBBED POLYIMIDE FILMS STUDIED BY SCANNING FORCE MICROSCOPY

Authors
KIM YB OLIN H PARK SY CHOI JW KOMITOV L MATUSZCZYK M LAGERWALL ST
Citation
Yb. Kim et al., RUBBED POLYIMIDE FILMS STUDIED BY SCANNING FORCE MICROSCOPY, Applied physics letters, 66(17), 1995, pp. 2218-2219
Citations number
20
Categorie Soggetti
Physics, Applied
Journal title
Applied physics letters → ACNP
ISSN journal
00036951
Volume
66
Issue
17
Year of publication
1995
Pages
2218 - 2219
Database
ISI
SICI code
0003-6951(1995)66:17<2218:RPFSBS>2.0.ZU;2-5