TRANSMISSION ELECTRON-MICROSCOPY AND ATOMIC-FORCE MICROSCOPY ANALYSISOF NB-AL-ALOX-NB SUPERCONDUCTING TUNNEL JUNCTION DETECTORS

Authors
RANDO N VIDELER P PEACOCK A VANDORDRECHT A VERHOEVE P VENN R WRIGHT AC LUMLEY J
Citation
N. Rando et al., TRANSMISSION ELECTRON-MICROSCOPY AND ATOMIC-FORCE MICROSCOPY ANALYSISOF NB-AL-ALOX-NB SUPERCONDUCTING TUNNEL JUNCTION DETECTORS, Journal of applied physics, 77(8), 1995, pp. 4099-4106
Citations number
15
Categorie Soggetti
Physics, Applied
Journal title
Journal of applied physics → ACNP
ISSN journal
00218979
Volume
77
Issue
8
Year of publication
1995
Pages
4099 - 4106
Database
ISI
SICI code
0021-8979(1995)77:8<4099:TEAAMA>2.0.ZU;2-D