CALCULATION OF STRAINED STATES IN SURFACE -STRUCTURES OF ARBITRARY SYSTEM FROM THE DATA OF A DOUBLE-CRYSTAL X-RAY-DIFFRACTOMETRY

Citation
Va. Ganshin et al., CALCULATION OF STRAINED STATES IN SURFACE -STRUCTURES OF ARBITRARY SYSTEM FROM THE DATA OF A DOUBLE-CRYSTAL X-RAY-DIFFRACTOMETRY, Kristallografia, 40(2), 1995, pp. 341-349
Citations number
47
Categorie Soggetti
Crystallography
Journal title
ISSN journal
00234761
Volume
40
Issue
2
Year of publication
1995
Pages
341 - 349
Database
ISI
SICI code
0023-4761(1995)40:2<341:COSSIS>2.0.ZU;2-6