SEU CROSS-SECTIONS DERIVED FROM A DIFFUSION ANALYSIS

A simple theoretical prediction of single-event upset (SEU) cross sect ion versus linear energy transfer (LET) is derived from a diffusion an alysis, and the result is compared to some real device curves, It was found that at least some real device curves show two regimes, One regi me (high-LET) is characterized by a very good fit to the theoretical p rediction, and the other (low-LET) is characterized by a very bad fit, The existence of a high-LET regime provides additional credibility fo r the increasingly popular postulate that diffusion has an important e ffect on the shape of the cross-sectional curve.