Ft. Brady et al., TOTAL-DOSE HARDENING OF SIMOX BURIED OXIDES FOR FULLY DEPLETED DEVICES IN RAD-TOLERANT APPLICATIONS, IEEE transactions on nuclear science, 43(6), 1996, pp. 2646-2650
A total dose hardening treatment is applied to SIMOX buried oxides, To
tal ionizing dose radiation testing is performed on fully-depleted tra
nsistors fabricated on both hardened and non-hardened substrates. At 2
00 krads x-ray dose, the front gate shift is reduced from -0.7 to -0.2
V for FETs built on the hardened wafers.