TOTAL-DOSE HARDENING OF SIMOX BURIED OXIDES FOR FULLY DEPLETED DEVICES IN RAD-TOLERANT APPLICATIONS

Authors
BRADY FT HUGHES HL MCMARR PJ MRSTIK B
Citation
Ft. Brady et al., TOTAL-DOSE HARDENING OF SIMOX BURIED OXIDES FOR FULLY DEPLETED DEVICES IN RAD-TOLERANT APPLICATIONS, IEEE transactions on nuclear science, 43(6), 1996, pp. 2646-2650
Citations number
6
Categorie Soggetti
Nuclear Sciences & Tecnology","Engineering, Eletrical & Electronic
Journal title
IEEE transactions on nuclear science → ACNP
ISSN journal
00189499
Volume
43
Issue
6
Year of publication
1996
Part
1
Pages
2646 - 2650
Database
ISI
SICI code
0018-9499(1996)43:6<2646:THOSBO>2.0.ZU;2-P
Abstract
A total dose hardening treatment is applied to SIMOX buried oxides, To tal ionizing dose radiation testing is performed on fully-depleted tra nsistors fabricated on both hardened and non-hardened substrates. At 2 00 krads x-ray dose, the front gate shift is reduced from -0.7 to -0.2 V for FETs built on the hardened wafers.