Shielding for space microelectronics needs to provide an acceptable do
se rate with minimum shield mass. The analysis presented here shows th
at the best approach is, in general, to use a graded-Z shield, with a
high-Z layer sandwiched between two low-Z materials. A graded-Z shield
is shown to reduce the electron dose rate by more than sixty percent
over a single-material shield of the same areal density. For protons,
the optimal shield would consist of a single, low-Z material layer. Ho
wever, it is shown that a graded-Z shield is nearly as effective as a
single-material shield, as long as a low-Z layer is located adjacent t
o the microelectronics. A specific shield design depends upon the deta
ils of the radiation environment, system model, design margins/levels,
compatibility of shield materials, etc. Therefore, we present here ge
neral principles for designing effective shields and describe how the
computer codes are used for this application.