MODELING THE HEAVY-ION CROSS-SECTION FOR SINGLE EVENT UPSET WITH TRACK STRUCTURE EFFECTS - THE HIC-UP-TS MODEL

Authors
CONNELL LW SEXTON FW MCDANIEL PJ PRINJA AK
Citation
Lw. Connell et al., MODELING THE HEAVY-ION CROSS-SECTION FOR SINGLE EVENT UPSET WITH TRACK STRUCTURE EFFECTS - THE HIC-UP-TS MODEL, IEEE transactions on nuclear science, 43(6), 1996, pp. 2814-2819
Citations number
15
Categorie Soggetti
Nuclear Sciences & Tecnology","Engineering, Eletrical & Electronic
Journal title
IEEE transactions on nuclear science → ACNP
ISSN journal
00189499
Volume
43
Issue
6
Year of publication
1996
Part
1
Pages
2814 - 2819
Database
ISI
SICI code
0018-9499(1996)43:6<2814:MTHCFS>2.0.ZU;2-7
Abstract
Whereas HIC-UP modeled the heavy ion strike as a line source of charge , HIC-UP-TS accounts for the spatial distribution of electron-hole-pai rs by using a 1/r(2) profile. The model compares well with experimenta l data.