SINGLE EVENT UPSET CROSS-SECTIONS AT VARIOUS DATA RATES

We present data which show that Single Event Upset (SEU) cross section varies linearly with frequency for most devices tested. We show that the SEU cross section can increase dramatically away from a linear rel ationship when the test setup is not optimized, or when testing near t he maximum operating frequency. We also observe non-linear behavior in some complex circuit topologies. Knowledge of the relationship betwee n SEU cross section and frequency is important for estimates of on-orb it SEU rates.