A SYSTEMS-ORIENTED SINGLE EVENT EFFECTS TEST APPROACH FOR HIGH-SPEED DIGITAL PHASE-LOCKED LOOPS

A systems-oriented single event effects (SEE) test approach is outline d here for two different phase-locked loop (PLL) application specific integrated circuits (ASICs) used for spaceborne local oscillator (LO) generation. The system considerations in designing the upset detection technique is described. This is the only known technique for getting information critical to the system about single event upset (SEU) sens itivity at speed for PLLs. Test results an presented for PLL devices o perating at clock speeds of 1.0 and 1.5 GHz. Significant frequency eff ects were not observed in these devices since the clock speed varied o nly 50%.