ELEVATED-TEMPERATURE IRRADIATION OF BIPOLAR LINEAR MICROCIRCUITS

In this study three conventional bipolar linear microcircuits, the LM1 01A operational amplifier, the LM124 quad operational. amplifier, and the LM139 quad voltage comparator, were irradiated at high dose rate, elevated temperature and the results compared to low dose rate, room t emperature response. While the high dose rate degradation at elevated temperature was greater than the degradation at room temperature, it w as not as great as the degradation at low dose rate. Therefore, a hard ness assurance test using elevated temperature irradiation at higher d ose rates, designed to bound the very low dose rate response, will pro bably have to include overtest.