Quartz crystal resonators were systematically irradiated with 65 MeV p
rotons to characterize low dose rate radiation-induced degradation Res
ults indicate: (1) test samples that exhibit large frequency shifts du
ring testing bend to show large frequency shifts prior to irradiation,
or during off-irradiation periods; (2) for radiation-sensitive sample
s, short-term effects seem to decrease after each irradiation on/off c
ycle (moreover, those devices in which radiation effects do not decrea
se after a few cycles ate not very sensitive); (3) the fabrication pro
cess may be an important determinant of susceptibility to low dose rad
iation-induced degradation; and (4) total-dose effects may be sublinea
r.