M. Potkonjak et al., CONSIDERING TESTABILITY AT BEHAVIORAL LEVEL - USE OF TRANSFORMATIONS FOR PARTIAL SCAN COST MINIMIZATION UNDER TIMING AND AREA CONSTRAINTS, IEEE transactions on computer-aided design of integrated circuits and systems, 14(5), 1995, pp. 531-546
We address the problem of transforming a behavioral specification so t
hat synthesis of a testable implementation from the new specification
requires significantly less area and partial scan cost than synthesis
from the original specification. The proposed approach has three compo
nents: a library of relevant transformation mechanisms, an objective f
unction, and an optimization algorithm, The most effective transformat
ions for testability optimization are identified by analyzing the fund
amental relationship between transformational mechanisms and topologic
al and functional properties of the computations that affect testabili
ty, A dynamic, two-stage objective function that estimates the area an
d testability of the final implementation, and also captures enabling
and disabling effects of the transformations, is developed. Optimizati
on is done using a new randomized branch and bound steepest descent al
gorithm, Application of the transformation algorithm on several benchm
ark examples demonstrates significant simultaneous improvement in both
area and testability of the final implementations.