CIRCUIT-LEVEL DICTIONARIES OF CMOS BRIDGING FAULTS

The contribution of this paper on the diagnosis (fault location) of CM OS bridging faults is threefold: First, the traditional fault dictiona ry (referred to as the full dictionary in this paper) is evaluated at the circuit level using a mixed-mode fault simulator, The fault set co nsists of randomly-generated gate input/output bridging faults. By usi ng mixed-mode gate- and electrical-level detection methods, good diagn ostic capability is achieved using only gate-level generated test sets . Second, we evaluate two reduced fault dictionaries, the pass/fail di ctionary and the count dictionary. Finally, the effectiveness of I-DDQ for diagnosis is examined. The results show that I-DDQ, combined with the proposed voltage detection methods, achieves the highest diagnost ic performance, with nearly complete diagnosis.