PRODUCTION OF CHARGE-INDUCED X-RAYS DURING PIXE STUDIES USING LIGHT AND HEAVY ION-BEAMS

Citation
Ae. Pillay et M. Peisach, PRODUCTION OF CHARGE-INDUCED X-RAYS DURING PIXE STUDIES USING LIGHT AND HEAVY ION-BEAMS, Journal of radioanalytical and nuclear chemistry, 200(1), 1995, pp. 53-74
Citations number
22
Categorie Soggetti
Chemistry Inorganic & Nuclear","Chemistry Analytical","Nuclear Sciences & Tecnology
ISSN journal
02365731
Volume
200
Issue
1
Year of publication
1995
Pages
53 - 74
Database
ISI
SICI code
0236-5731(1995)200:1<53:POCXDP>2.0.ZU;2-Y
Abstract
A recently discovered phenomenon of excessively high X-ray production is discussed. The high yield is attributed to the build-up of potentia l on non-conducting targets irradiated with accelerated ion beams, and the subsequent discharge. Ion-beams of H-1(+), H-1(2)+, H-2(+), H-2(2 )+, He-3(+), He-3(2+), He-4(+), N-14(+), N-14(2+), O-16(+) and Ne-20() were used. A new mechanism of X-ray excitation is proposed. The incr eased X-ray fluxes produced by this process are suitable for analytica l applications of high specificity. The mechanism of excitation associ ated with the process, factors affecting the high X-ray yields, applic ations and a general overview of the studies undertaken with the vario us ion beams are given.