Ae. Pillay et M. Peisach, PRODUCTION OF CHARGE-INDUCED X-RAYS DURING PIXE STUDIES USING LIGHT AND HEAVY ION-BEAMS, Journal of radioanalytical and nuclear chemistry, 200(1), 1995, pp. 53-74
A recently discovered phenomenon of excessively high X-ray production
is discussed. The high yield is attributed to the build-up of potentia
l on non-conducting targets irradiated with accelerated ion beams, and
the subsequent discharge. Ion-beams of H-1(+), H-1(2)+, H-2(+), H-2(2
)+, He-3(+), He-3(2+), He-4(+), N-14(+), N-14(2+), O-16(+) and Ne-20() were used. A new mechanism of X-ray excitation is proposed. The incr
eased X-ray fluxes produced by this process are suitable for analytica
l applications of high specificity. The mechanism of excitation associ
ated with the process, factors affecting the high X-ray yields, applic
ations and a general overview of the studies undertaken with the vario
us ion beams are given.