CHANNELING-ENHANCED MICROANALYSIS USING [111]-ZONE-AXIS AND [001]-ZONE-AXIS BEAM INCIDENCE FOR L1(2)-TYPE NI-3(AL,TA)

Authors
HORITA Z MCCARTNEY MR KUNINAKA H
Citation
Z. Horita et al., CHANNELING-ENHANCED MICROANALYSIS USING [111]-ZONE-AXIS AND [001]-ZONE-AXIS BEAM INCIDENCE FOR L1(2)-TYPE NI-3(AL,TA), Philosophical magazine. A. Physics of condensed matter. Structure, defects and mechanical properties, 75(1), 1997, pp. 153-167
Citations number
22
Categorie Soggetti
Physics, Applied","Material Science","Physics, Condensed Matter","Metallurgy & Metallurigical Engineering
Journal title
Philosophical magazine. A. Physics of condensed matter. Structure, defects and mechanical properties → ACNP
ISSN journal
13642804
Volume
75
Issue
1
Year of publication
1997
Pages
153 - 167
Database
ISI
SICI code
1364-2804(1997)75:1<153:CMU[A[>2.0.ZU;2-M
Abstract
Site occupancy has been determined using the channelling-enhanced micr oanalysis for a Ni-3(Al,Ta) intermetallic compound with the Ll(2)-type crystal structure. It is shown that there is a large scattering of da ta points for [001] beam incidence compared with [111] beam incidence. The reasons for this difference are examined by simulating channellin g electron distribution on the Al and Ni columns. It is concluded that the large scattering for the [001] beam incidence is due to the indis tinguishable difference between channelling electron intensities on th e Al and Ni columns.