EXCESS NOISE, STRUCTURAL-PROPERTIES, AND THEIR EFFECTS ON BOLOMETRIC PERFORMANCE OF THIN SUPERCONDUCTING FILMS ON SILICON MEMBRANES

Authors
NEFF H SCHAUBE W LAUKEMPER J BURNUS M HEIDENBLUT T HEFLE G SCHWIERZI B MICHALKE W STEINBEISS E
Citation
H. Neff et al., EXCESS NOISE, STRUCTURAL-PROPERTIES, AND THEIR EFFECTS ON BOLOMETRIC PERFORMANCE OF THIN SUPERCONDUCTING FILMS ON SILICON MEMBRANES, Journal of applied physics, 77(9), 1995, pp. 4580-4583
Citations number
11
Categorie Soggetti
Physics, Applied
Journal title
Journal of applied physics → ACNP
ISSN journal
00218979
Volume
77
Issue
9
Year of publication
1995
Pages
4580 - 4583
Database
ISI
SICI code
0021-8979(1995)77:9<4580:ENSATE>2.0.ZU;2-5