THEORY OF MICROSTRUCTURAL DEPTH PROFILING BY PHOTOTHERMAL MEASUREMENTS

Authors
LAN TTN SEIDEL U WALTHER HG
Citation
Ttn. Lan et al., THEORY OF MICROSTRUCTURAL DEPTH PROFILING BY PHOTOTHERMAL MEASUREMENTS, Journal of applied physics, 77(9), 1995, pp. 4739-4745
Citations number
13
Categorie Soggetti
Physics, Applied
Journal title
Journal of applied physics → ACNP
ISSN journal
00218979
Volume
77
Issue
9
Year of publication
1995
Pages
4739 - 4745
Database
ISI
SICI code
0021-8979(1995)77:9<4739:TOMDPB>2.0.ZU;2-1