TEXTURE ANALYSIS OF CHEMICAL-VAPOR-DEPOSITED DIAMOND FILMS ON SILICONBY THE COMPONENT METHOD

Authors
HELMING K GEIER S SCHRECK M HESSMER R STRITZKER B RAUSCHENBACH B
Citation
K. Helming et al., TEXTURE ANALYSIS OF CHEMICAL-VAPOR-DEPOSITED DIAMOND FILMS ON SILICONBY THE COMPONENT METHOD, Journal of applied physics, 77(9), 1995, pp. 4765-4770
Citations number
10
Categorie Soggetti
Physics, Applied
Journal title
Journal of applied physics → ACNP
ISSN journal
00218979
Volume
77
Issue
9
Year of publication
1995
Pages
4765 - 4770
Database
ISI
SICI code
0021-8979(1995)77:9<4765:TAOCDF>2.0.ZU;2-2