AN ELECTRON-PARAMAGNETIC-RESONANCE STUDY OF VANADIUM-RELATED DEFECTS IN CDTE-V-ZN

Citation
Jc. Launay et al., AN ELECTRON-PARAMAGNETIC-RESONANCE STUDY OF VANADIUM-RELATED DEFECTS IN CDTE-V-ZN, Semiconductor science and technology, 12(1), 1997, pp. 47-50
Citations number
16
Categorie Soggetti
Engineering, Eletrical & Electronic","Physics, Condensed Matter","Material Science
ISSN journal
02681242
Volume
12
Issue
1
Year of publication
1997
Pages
47 - 50
Database
ISI
SICI code
0268-1242(1997)12:1<47:AESOVD>2.0.ZU;2-H
Abstract
The formation of vanadium-related defects and defect complexes in CdTe codoped with Zn and V has been studied using electron paramagnetic re sonance (EPR). Whereas in Zn-free crystals only the V3+ defect and in 5% and 10% Zn-alloyed ZnCdTe only a V2+-X complex were previously obse rved by EPR, both defects are observed simultaneously under thermal eq uilibrium conditions in low-concentration (10(19) cm(-3)) Zn- and V-co doped samples. As a SIMS impurity analysis does not show contamination at the 10(17) cm(-3) level, the model of second nearest neighbour com plexes V-Cd-Zn-Cd seems to be appropriate. The concentration of the V- Cd-Zn-Cd defects is much higher than expected from a statistical distr ibution of Zn and V.