EXCITON SPECTRA AND SPIN-ORBIT-SPLITTING IN GAN EPITAXIAL-FILMS

Authors
Citation
Jw. Orton, EXCITON SPECTRA AND SPIN-ORBIT-SPLITTING IN GAN EPITAXIAL-FILMS, Semiconductor science and technology, 12(1), 1997, pp. 64-68
Citations number
27
Categorie Soggetti
Engineering, Eletrical & Electronic","Physics, Condensed Matter","Material Science
ISSN journal
02681242
Volume
12
Issue
1
Year of publication
1997
Pages
64 - 68
Database
ISI
SICI code
0268-1242(1997)12:1<64:ESASIG>2.0.ZU;2-F
Abstract
This paper is concerned with the interpretation of experimental data o n free exciton energies in GaN epitaxial films grown on various substr ates (sapphire, SiC and GaN). In hexagonal (wurtzite) films the degene racy in the valence band is completely lifted and three excitons can b e observed by reflectivity and photoluminescence excitation spectrosco py. Their energies can be interpreted in terms of the quasi-cubic mode l of Hopfield which involves two parameters, Delta(so) the spin-orbit splitting and Delta(CR) the axial crystal field energy, which may, in principle, be derived from measurement of the energy differences E(C) - E(A) and E(B) - E(A). In practice, experimental data show considerab le variation; this variation is thought to be due to strain in the fil ms introduced as a result of differential thermal expansion during coo l-down from the growth temperature to room temperature, and direct cal culation of the spin-orbit and crystal field parameters for each sampl e results in apparently random values. In particular, the values of De lta(so) obtained differ considerably from that measured (unambiguously ) on a cubic (zinc blende) film, Delta(so) = 17 meV. We show that it i s possible to resolve these dificulties, following an idea introduced by Gil at al (1995), by plotting E(C) and E(B) aginst E(A) for the var ious samples and obtaining a fit to the data thus displayed. We then f ind that an excellent fit can be obtained using the quasi-cubic model with Delta(so) = 17 meV and Delta(CR) ranging from 13 meV to 37 meV ov er the range of samples for which appropriate data have been published .