This paper is concerned with the interpretation of experimental data o
n free exciton energies in GaN epitaxial films grown on various substr
ates (sapphire, SiC and GaN). In hexagonal (wurtzite) films the degene
racy in the valence band is completely lifted and three excitons can b
e observed by reflectivity and photoluminescence excitation spectrosco
py. Their energies can be interpreted in terms of the quasi-cubic mode
l of Hopfield which involves two parameters, Delta(so) the spin-orbit
splitting and Delta(CR) the axial crystal field energy, which may, in
principle, be derived from measurement of the energy differences E(C)
- E(A) and E(B) - E(A). In practice, experimental data show considerab
le variation; this variation is thought to be due to strain in the fil
ms introduced as a result of differential thermal expansion during coo
l-down from the growth temperature to room temperature, and direct cal
culation of the spin-orbit and crystal field parameters for each sampl
e results in apparently random values. In particular, the values of De
lta(so) obtained differ considerably from that measured (unambiguously
) on a cubic (zinc blende) film, Delta(so) = 17 meV. We show that it i
s possible to resolve these dificulties, following an idea introduced
by Gil at al (1995), by plotting E(C) and E(B) aginst E(A) for the var
ious samples and obtaining a fit to the data thus displayed. We then f
ind that an excellent fit can be obtained using the quasi-cubic model
with Delta(so) = 17 meV and Delta(CR) ranging from 13 meV to 37 meV ov
er the range of samples for which appropriate data have been published
.