The electrical behaviour of metal/diamond/silicon structures was inves
tigated by current-voltage measurements as a function of temperature i
n the range 20-270 degrees C. The results were related to the morpholo
gy and composition of the diamond film by a nonlinear electrical model
, taking into account both a temperature-independent conductance throu
gh highly defective regions and a temperature-dependent field-activate
d conductance through bulk diamond grains.