T. Mukaihara et al., LOW-THRESHOLD MESA-ETCHED VERTICAL-CAVITY INGAAS GAAS SURFACE-EMITTING LASERS GROWN BY MOCVD/, Electronics Letters, 31(8), 1995, pp. 647-648
The authors have demonstrated a low threshold current of 0.33 mA and a
threshold current density of 380 A/cm(2) for MOCVD-grown InGaAs/GaAs
vertical-cavity surface-emitting lasers with a pillar etched structure
. The thermal characteristic of the fabricated device including therma
l resistance and junction temperature rise is also discussed. Judging
from this experiment, further reduction of threshold current can be ex
pected by reducing nonradiative recombination and electrical resistanc
e.