MMIC-CALIBRATED PROBING BY CW ELECTROOPTIC MODULATION

This paper describes an electrooptic probing technique using a cw semi conductor-laser beam associated with a fast photodetector, Besides its simplicity, this technique presents some advantages over the sampling one thanks to the presence of a Fabry-Perot effect, namely an enhance ment of the electrooptic interaction and a simple solution to the cali bration problem, The good validity of the calibration method allows th e application of this technique to S-parameter measurements. The S-par ameter determination, in modulus and in phase, of an industrial MMIC b y the electrooptic method is reported and compared with direct network analyzer measurements.