TEM STUDIES OF DAMAGE-INDUCED IN SICF-SIC COMPOSITES IRRADIATED WITH SWIFT XE IONS

Authors
SEBIRELHERMITTE I VICENS J CHERMANT JL LEVALOIS M PAUMIER E
Citation
I. Sebirelhermitte et al., TEM STUDIES OF DAMAGE-INDUCED IN SICF-SIC COMPOSITES IRRADIATED WITH SWIFT XE IONS, Journal of Materials Science, 30(8), 1995, pp. 2115-2120
Citations number
24
Categorie Soggetti
Material Science
Journal title
Journal of Materials Science → ACNP
ISSN journal
00222461
Volume
30
Issue
8
Year of publication
1995
Pages
2115 - 2120
Database
ISI
SICI code
0022-2461(1995)30:8<2115:TSODIS>2.0.ZU;2-1
Abstract
This paper concerns the behaviour of a structural ceramic matrix compo site, SiCf-SiC, irradiated with swift xenon ions, with a fluence of up to 10(15) Xe cm(-2). Damaged materials were investigated by transmiss ion electron microscopy along the beam penetration. Damages are mainly located at the fibre-matrix interfaces, where amorphous zones are evi nced in the turbostratic carbon interphase, as well as in the fibres t hemselves. Latent tracks have also been observed in the fibre close to the fibre-matrix interface.