HIGH-RESOLUTION ELECTRON-MICROSCOPY OF NANOSTRUCTURED MATERIALS

Authors
JOSEYACAMAN M
Citation
M. Joseyacaman, HIGH-RESOLUTION ELECTRON-MICROSCOPY OF NANOSTRUCTURED MATERIALS, Nanostructured materials, 5(2), 1995, pp. 171-178
Citations number
10
Categorie Soggetti
Material Science
Journal title
Nanostructured materials → ACNP
ISSN journal
09659773
Volume
5
Issue
2
Year of publication
1995
Pages
171 - 178
Database
ISI
SICI code
0965-9773(1995)5:2<171:HEONM>2.0.ZU;2-B
Abstract
In the present work we discuss some of the applications of High Resolu tion Electron Microscopy (NREM) to the characterization of the nanopha se materials. Some of the principles are discussed and two examples ar e shown: individual nanosized particles and, secondly, particles which have already coalesced, The state of the complex particles are compar ed with theoretical predictions.