EXPERIMENTAL HIGH-RESOLUTION ELECTRON-MICROSCOPY OF POLYMERS

High-resolution imaging of ordered polymers is described both theoreti cally and experimentally. The relationship between the actual three-di mensional specimen structure and the resultant two-dimensional image i ntensity distribution is developed using the multislice formalism. The influence of the electron optical conditions on the image is demonstr ated with experimental data, as well as with image simulations. Practi cal details of specimen preparation, as well as the effects of specime n structural defects on the image, are presented. A significant challe nge for polymer microscopists is to minimize the deleterious effects o f electron beam damage and to identify image artifacts resulting from damage. Future applications of ultrahigh-resolution capabilities are i llustrated with respect to direct imaging of the anisotropic potential s present in covalently bonded materials.