SCANNING PROBE MICROSCOPY OF ORGANIC AND POLYMERIC FILMS - FROM SELF-ASSEMBLED MONOLAYERS TO COMPOSITE MULTILAYERS

Citation
Vv. Tsukruk et Dh. Reneker, SCANNING PROBE MICROSCOPY OF ORGANIC AND POLYMERIC FILMS - FROM SELF-ASSEMBLED MONOLAYERS TO COMPOSITE MULTILAYERS, Polymer, 36(9), 1995, pp. 1791-1808
Citations number
133
Categorie Soggetti
Polymer Sciences
Journal title
ISSN journal
00323861
Volume
36
Issue
9
Year of publication
1995
Pages
1791 - 1808
Database
ISI
SICI code
0032-3861(1995)36:9<1791:SPMOOA>2.0.ZU;2-5
Abstract
We discuss the results of scanning probe microscopy studies of the sur face morphology of ordered molecular films from organic low-molecular- mass and polymeric compounds. Films considered include: self-assembled monolayers, Langmuir-Blodgett films and composite molecular films fab ricated from different organic compounds. Several aspects of these sys tems are revealed: their nanoscale surface morphology, typical natural ly occurring defects of the surfaces and molecular-scale ordering. Sur face modification of soft organic materials during scanning with the a tomic force microscopy (AFM) tip is considered as well. For various cl asses of ordered molecular films, application of the AFM technique and other scanning probe techniques such as lateral force microscopy prod uce a new level of in situ quantitative characterization of molecular films on micrometre, submicrometre and molecular scales.